E. Dovidenko: search on Z-Library

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1

Morpho butterfly wing scales demonstrate highly selective vapour response

Potyrailo, Radislav A., Ghiradella, Helen, Vertiatchikh, Alexei, Dovidenko, Katharine, Cournoyer, James R., Olson, Eric

Journal:

Nature Photonics

Year:

2007

Language:

english

File:

PDF, 760 KB

english, 2007

2

Biaxial compression in GaAs thin films grown on Si

V. Joshkin, A. Orlikovsky, S. Oktyabrsky, K. Dovidenko, A. Kvit, I. Muhamedzanov, E. Pashaev

Journal:

Journal of Crystal Growth

Year:

1995

Language:

english

File:

PDF, 948 KB

english, 1995

3

Chemical Vapor Deposition of ZnS:Mn for Thin-Film Electroluminescent Display Applications

Topol, Anna W., Dunn, Kathleen A., Barth, Karl W., Nuesca, Guillermo M., Taylor, Brian K., Dovidenko, Katharine, Kaloyeros, Alain E., Tuenge, Richard T., King, Chris N.

Journal:

Journal of Materials Research

Year:

2004

Language:

english

File:

PDF, 629 KB

english, 2004

4

Saturation of optical transitions in quantum dots and wires of porous silicon

V. Dneprovskii, N. Gushina, D. Okorokov, V. Karavanskii, E. Dovidenko

Journal:

Superlattices and Microstructures

Year:

1995

File:

PDF, 251 KB

1995

5

Thermal reactions and micro-structure of TiN–AlN layered nano-composites

V.P. Godbole, K. Dovidenko, A.K. Sharma, J. Narayan

Journal:

Materials Science and Engineering: B

Year:

1999

Language:

english

File:

PDF, 466 KB

english, 1999

6

Encyclopedia of Materials: Science and Technology || Dislocations and Related Defects in IIINitride Heterostructures

Year:

2001

Language:

english

File:

PDF, 491 KB

english, 2001

7

Shape Engineered InAs Quantum Dots with Stabilized Electronic Properties

Tokranov, V., Yakimov, M., Katsnelson, A., Dovidenko, K., Lamberti, M., Oktyabrsky, S.

Journal:

MRS Proceedings

Year:

2002

Language:

english

File:

PDF, 272 KB

english, 2002

8

Cross-sectional mapping of hole concentrations as a function of copper treatment in CdTe photo-voltaic devices

Korevaar, Bas A., Zorn, Gilad, Raghavan, Kamala C., Cournoyer, James R., Dovidenko, Katharine

Journal:

Progress in Photovoltaics: Research and Applications

Year:

2014

Language:

english

File:

PDF, 745 KB

english, 2014

9

Microstructural Effects in the Thermochromic Behavior of VO2/Al/Si Thin Film Heterostructures

Dovidenko, K., Beasor, S., Topol, A., Efstathiadis, H., Oktyabrsky, S., Shokhor, S., Naar, S., Kaloyeros, A.E.

Journal:

MRS Proceedings

Year:

2000

Language:

english

File:

PDF, 1.96 MB

english, 2000

10

SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Quantum Dot Devices and Computing - InAs quantum dot laser diodes: structure, characteristics, and temperature dependence

Tokranov, Vadim E., Yakimov, Michael, Katsnelson, Alex, Dovidenko, Katharine, Todt, Rene, Oktyabrsky, Serge, Lott, James A., Ledentsov, Nikolai N., Malloy, Kevin J., Kane, Bruce E., Sigmon, Thomas W.

Year:

2002

Language:

english

File:

PDF, 431 KB

english, 2002

11

The influence of the native BaAl2O4 boundary layer on microstructure and properties of YBa2Cu3O7−x thin films grown on sapphire

K. Dovidenko, S. Oktyabrsky, D. Tokarchuk, A. Michaltsov, A. Ivanov

Journal:

Materials Science and Engineering: B

Year:

1992

Language:

english

File:

PDF, 864 KB

english, 1992

12

Growth and structure of epitaxial Al and Cu films on CaF2

Y.V Shusterman, N.L Yakovlev, K Dovidenko, L.J Schowalter

Journal:

Thin Solid Films

Year:

2003

Language:

english

File:

PDF, 837 KB

english, 2003

13

Epitaxial Growth of Aluminum Nitride on Sapphire and Silicon

Dovidenko, K., Oktyabrsky, S., Narayan, J., Razeghi, M.

Journal:

MRS Proceedings

Year:

1994

Language:

english

File:

PDF, 3.22 MB

english, 1994

14

Comparative Study of Typical Defects in III-Nitride Thin Films and Their Alloys

Dovidenko, K., Oktyabrsky, S., Narayan, J., Joshkin, V., Razeghi, M.

Journal:

MRS Proceedings

Year:

1997

Language:

english

File:

PDF, 2.11 MB

english, 1997

15

Preparation and Characterization of Single-crystal Aluminum Nitride Substrates

Schowalter, Leo J., Rojo, J. Carlos, Yakolev, Nikolai, Shusterman, Yuriy, Dovidenko, Katherine, Wang, Rungjun, Bhat, Ishwara, Slack, Glen A.

Journal:

MRS Proceedings

Year:

1999

Language:

english

File:

PDF, 1.00 MB

english, 1999

16

CRYSTAL STRUCTURE AND DEFECTS IN NITROGEN-DEFICIENT GaN

Oktyabrsky, S., Dovidenko, K., Sharma, A. K., Joshkin, V., Narayan, J.

Journal:

MRS Internet Journal of Nitride Semiconductor Research

Year:

1999

File:

PDF, 243 KB

1999

17

Defects and interfaces in epitaxial ZnO/α-Al[sub 2]O[sub 3] and AlN/ZnO/α-Al[sub 2]O[sub 3] heterostructures

Narayan, J., Dovidenko, K., Sharma, A. K., Oktyabrsky, S.

Journal:

Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 716 KB

english, 1998

18

The microstructure of YBa2Cu3O7−x thin films grown on sapphire

K. Dovidenko, S. Oktyabrsky, A. Ivanov, A. Michaltsov, D. Tokarchuk, L. Zherikhina

Journal:

Physica C: Superconductivity

Year:

1991

Language:

english

File:

PDF, 923 KB

english, 1991

19

Focused ion beam microscope as an analytical tool for nanoscale characterization of gradient-formulated polymeric sensor materials

Dovidenko, Katharine, Potyrailo, Radislav A., Grande, Games

Journal:

MRS Proceedings

Year:

2005

Language:

english

File:

PDF, 1.42 MB

english, 2005

20

The Microstructural Study of Aluminum Nitride Thin Films: Epitaxy on the Two Orientations of Sapphire and Texturing on Si

DOVIDENKO, K., OKTYABRSKY, S., NARAYAN, J., RAZEGHI, M.

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 3.11 MB

english, 1995

21

Preparation and Characterization of Single-crystal Aluminum Nitride Substrates

Schowalter, Leo J., Carlos Rojo, J., Yakolev, Nikolai, Shusterman, Yuriy, Dovidenko, Katherine, Wang, Rungjun, Bhat, Ishwara, Slack, Glen A.

Journal:

MRS Internet Journal of Nitride Semiconductor Research

Year:

2000

File:

PDF, 1.01 MB

2000

22

Characteristics of stacking faults in AlN thin films

Dovidenko, K., Oktyabrsky, S., Narayan, J.

Journal:

Journal of Applied Physics

Year:

1997

Language:

english

File:

PDF, 690 KB

english, 1997

23

Exploration of a Butterfly Wing Using a Diverse Suite of Characterization Techniques

Smentkowski, V, Ostrowski, S, Olson, E, Cournoyer, J, Dovidenko, K, Potyrailo, R

Journal:

Microscopy and Microanalysis

Year:

2006

Language:

english

File:

PDF, 910 KB

english, 2006

24

Nano-scale 3-D Characterization of Materials Using FIB-SEM

Dovidenko, K, Ellis, D, Grande, J, Potyrailo, RA

Journal:

Microscopy and Microanalysis

Year:

2006

Language:

english

File:

PDF, 268 KB

english, 2006

25

Physical Properties and Diffusion Characteristics of CVD-Grown TiSiN Films

Anjum, Dalaver, Dovidenko, Katharine, Oktyabrsky, Serge, Eisenbraun, Eric, Kaloyeros, Alain E.

Journal:

MRS Proceedings

Year:

2001

Language:

english

File:

PDF, 857 KB

english, 2001

26

MOCVD ZnS:Mn Films: Grain Size Distribution and Crystal Structure as a Function of the Growth Parameters

Dunn, Kathleen A., Dovidenko, Katharine, Topol, Anna W., Oktyabrsky, Serge R., Kaloyeros, Alain E.

Journal:

MRS Proceedings

Year:

2001

Language:

english

File:

PDF, 2.69 MB

english, 2001

27

FIB-assisted Pt Deposition for Carbon Nanotube Integration and 3-D Nanoengineering

Dovidenko, K., Rullan, J., Moore, R., Dunn, K. A., Geer, R. E., Heuchling, F.

Journal:

MRS Proceedings

Year:

2002

Language:

english

File:

PDF, 2.41 MB

english, 2002

28

Solar Review: Characterizing Thin Film Photovoltaics

Dovidenko, K, Cournoyer, J, Vernooy, D, Lita, B, Seymour, F

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 502 KB

english, 2010

29

[IEEE TRANSDUCERS 2009 - 2009 International Solid-State Sensors, Actuators and Microsystems Conference - Denver, CO, USA (2009.06.21-2009.06.25)] TRANSDUCERS 2009 - 2009 International Solid-State Sensors, Actuators and Microsystems Conference - Label-free biosensing using passive radio-frequency identification (RFID) sensors

Potyrailo, R. A., Surman, C., Chen, R., Go, S., Dovidenko, K., Morris, W. G., Holwitt, E., Sorola, V., Kiel, J.L.

Year:

2009

Language:

english

File:

PDF, 1.59 MB

english, 2009

30

Sample Preparation Challenges in Advanced Semiconductor Test Structures

Demarest, James J., Tierney, Lukas, Lu, Yinggang, Dovidenko, Katharine

Journal:

Microscopy and Microanalysis

Year:

2019

Language:

english

File:

PDF, 187 KB

english, 2019

31

MOCVD ZnS:Mn Films: Crystal Structure and Defect Microstructure as a Function of the Growth Parameters

Dunn, Kathleen A., Dovidenko, Katharine, Topol, Anna W., Shekhawat, Gajendra S., Geer, Robert E., Kaloyeros, Alain E.

Journal:

MRS Proceedings

Year:

2001

Language:

english

File:

PDF, 2.82 MB

english, 2001

32

Strong optical nonlinearities in quantum wires and dots of porous silicon

V. Dneprovskii, A. Eev, N. Gushina, D. Okorokov, V. Panov, V. Karavanskii, A. Maslov, V. Sokolov, E. Dovidenko

Journal:

physica status solidi (b)

Year:

1995

Language:

english

File:

PDF, 638 KB

english, 1995

33

Observation of Luminescence from Defects in 4H-SiC APDs Operating in Avalanche Breakdown

Soloviev, Stanislav I., Sandvik, Peter M., Vertiatchikh, Alexei, Dovidenko, K., Cha, Ho Young

Journal:

Materials Science Forum

Year:

2009

Language:

english

File:

PDF, 418 KB

english, 2009

34

Low temperature inorganic chemical vapor deposition of Ti–Si–N diffusion barrier liners for gigascale copper interconnect applications

E. Eisenbraun, A. Upham, R. Dash, W. Zeng, J. Hoefnagels, S. Lane, D. Anjum, K. Dovidenko, A. Kaloyeros, B. Arkles, J. J. Sullivan

Year:

2000

Language:

english

File:

PDF, 591 KB

english, 2000

35

YBa2Cu3O7-ysingle-crystal growth by the method of horizontally directed temperature gradient

G. G. Kacharava, Y. F. El'tsev, V. R. Karasik, E. Y. Dovidenko, G. A. Tsintsadze

Year:

1991

Language:

english

File:

PDF, 320 KB

english, 1991

36

Inversion Domain Boundaries in Ain and GaN Thin Films

Dovidenko, K., Oktyabrsky, S., Narayan, J.

Journal:

Microscopy and Microanalysis

Year:

1998

File:

PDF, 2.02 MB

1998

37

New methods for fabricating patterned lithium niobate for photonic applications

V. Joshkin, K. Dovidenko, S. Oktyabrsky, D. Saulys, T. Kuech, L. McCaughan

Journal:

Journal of Crystal Growth

Year:

2003

Language:

english

File:

PDF, 282 KB

english, 2003

38

The Effect of Alloying on Nb–Silicide Phase Stability

Bewlay, B P, Dovidenko, K

Journal:

Microscopy and Microanalysis

Year:

2005

Language:

english

File:

PDF, 607 KB

english, 2005

39

Influence of oxygen background pressure on crystalline quality of SrTiO[sub 3] films grown on MgO by pulsed laser deposition

Kalyanaraman, R., Vispute, R. D., Oktyabrsky, S., Dovidenko, K., Jagannadham, K., Narayan, J., Budai, J. D., Parikh, N., Suvkhanov, A.

Journal:

Applied Physics Letters

Year:

1997

Language:

english

File:

PDF, 586 KB

english, 1997

40

Epitaxial Al and Cu films grown on CaF2/Si(111)

Shusterman, Yuriy V., Yakovlev, Nikolai L., Dovidenko, Katharine, Schowalter, Leo J.

Journal:

MRS Proceedings

Year:

2000

Language:

english

File:

PDF, 1.15 MB

english, 2000

41

Fracturing mechanism and dust yield dynamics in impact breakage of permafrost

V. R. Larionov, N. Kh. Muksunov, G. P. Dovidenko

Journal:

Journal of Mining Science

Year:

1988

Language:

english

File:

PDF, 304 KB

english, 1988

42

Nature's Engineering Marvels: the Structure and Chemistry of a Butterfly Wing

Smentkowski, V.S., Ostrowski, S.G., Olson, E.J., Cournoyer, J., Dovidenko, K., Potyrailo, R.A.

Journal:

Microscopy Today

Year:

2006

Language:

english

File:

PDF, 1.69 MB

english, 2006

43

Cubic GaN formation under nitrogen-deficient conditions

Oktyabrsky, S., Dovidenko, K., Sharma, A. K., Narayan, J., Joshkin, V.

Journal:

Applied Physics Letters

Year:

1999

Language:

english

File:

PDF, 599 KB

english, 1999

44

Millimeter-scale surface nano-structuring using focused ion beam milling

Dovidenko, Katharine, Potyrailo, Radislav A., Le Tarte, Laurie A.

Journal:

MRS Proceedings

Year:

2005

Language:

english

File:

PDF, 1.37 MB

english, 2005

45

[IEEE Proceedings of the IEEE 2001 International Interconnect Technology Conference - Burlingame, CA, USA (2001.06.6-2001.06.6)] Proceedings of the IEEE 2001 International Interconnect Technology Conference (Cat. No.01EX461) - Atomic layer deposition (ALD) of tantalum-based materials for zero thickness copper barrier applications

Eisenbraun, E., van der Straten, O., Yu Zhu,, Dovidenko, K., Kaloyeros, A.

Year:

2001

Language:

english

File:

PDF, 243 KB

english, 2001

46

Site-specific cross-sectioning of carbon nanotube-to-metal junctions for high spatial resolution chemical and structural analysis

Dovidenko, K., Abramson, N. L., Rullan, J.

Journal:

MRS Proceedings

Year:

2002

Language:

english

File:

PDF, 1.18 MB

english, 2002

47

CRYSTAL STRUCTURE AND DEFECTS IN NITROGEN-DEFICIENT GaN

Oktyabrsky, S., Dovidenko, K., Sharma, A. K., Joshkin, V., Narayan, J.

Journal:

MRS Internet Journal of Nitride Semiconductor Research

Year:

1999

Language:

english

File:

PDF, 243 KB

english, 1999

48

Chemical Vapor Deposition of ZnS:Mn for Thin-Film Electroluminescent Display Applications

Topol, Anna W., Dunn, Kathleen A., Barth, Karl W., Nuesca, Guillermo M., Taylor, Brian K., Dovidenko, Katharine, Kaloyeros, Alain E., Tuenge, Richard T., King, Chris N.

Journal:

Journal of Materials Research

Year:

2004

Language:

english

File:

PDF, 638 KB

english, 2004

49

Solving Characterization Challenges for CdTe-Based Thin Film Photovoltaics: Comparison of Analytical Techniques

Dovidenko, K, Smentkowski, VS, Riccobono, O, Tarte, LA Le, Piao, H, Heward, W, Ellis, D, Neander, R, Johnson, JN, Korevaar, BA, DeLuca, JA

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 220 KB

english, 2009

50

Compact Terahertz SPICE Model: Effects of Drude Inductance and Leakage

Liu, Xueqing, Dovidenko, Katharine, Park, Junsung, Ytterdal, Trond, Shur, Michael S.

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 1.17 MB

english, 2018

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